Title :
High voltage subnanosecond corona inception
Author :
Mankowski, J. ; Dickens, J. ; Kristiansen, M. ; Lehr, Jane ; Prather, W. ; Gaudet, J.
Author_Institution :
Dept. of Electr. Eng. & Phys., Texas Tech. Univ., Lubbock, TX, USA
Abstract :
Summary form only given. Corona discharges caused by ultra-fast pulses are of concern in systems that create and radiate these pulses. Corona discharge in these systems can have adverse effects such as pulse reflection, phase dispersion, and significant power losses. We have experimentally observed corona development and discharge in this type of environment under several conditions. E-field, gas pressure and pulse repetition rates have all been varied and the resultant corona observed. Several gas dielectrics, including air, SF/sub 6/, and admixtures of SF/sub 6/ and N/sub 2/ have been used. Applied pulse characteristics vary from 10 to 300 kV, 0.3 to 1.5 nsec risetimes, 1 to 100 nsec FWHM, and rep-rates from single shot to 5 kHz. Both coaxial and point-plane geometries are used in the test gap. Observations of the corona inception are made with a streak camera and an image intensifying CCD framing camera. The streak camera provides information on corona development of a single pulse, while the CCD framing camera provides an integrated image of the ionized region during a series of pulses.
Keywords :
corona; image intensifiers; photographic applications; plasma diagnostics; streak photography; 0.3 to 1.5 ns; 1 to 100 ns; 10 to 500 kV; 5 kHz; E-field; SF/sub 6/; SF/sub 6/-N/sub 2/; SF/sub 6/-N/sub 2/ mixture; air; coaxial geometries; corona development; corona discharges; corona inception; gas dielectrics; gas pressure; high voltage subnanosecond corona inception; image intensifying CCD framing camera; integrated image; ionized region; phase dispersion; point-plane geometries; power losses; pulse characteristics; pulse reflection; pulse repetition rates; rep-rates; risetimes; single pulse; streak camera; ultra-fast pulses; Charge coupled devices; Charge-coupled image sensors; Coaxial components; Corona; Dielectrics; Dispersion; Geometry; Reflection; Testing; Voltage;
Conference_Titel :
Plasma Science, 1999. ICOPS '99. IEEE Conference Record - Abstracts. 1999 IEEE International Conference on
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-5224-6
DOI :
10.1109/PLASMA.1999.828779