DocumentCode
1705558
Title
SLOP-LDMOS - a novel super-junction concept LDMOS and its experimental demonstration
Author
Zhang, Bo ; Chen, Lin ; Wu, Tie ; Li, Zhaoji
Author_Institution
Center of IC Design, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Volume
2
fYear
2005
Lastpage
1402
Abstract
In this paper, a novel surface low on-resistance path lateral double-diffusion MOSFET (SLOP-LDMOS), based on the super junction (SJ) concept, is presented and experimentally demonstrated for the first time. The key feature of this new structure is that the super junction primarily provides the low on-resistance path and it is just located at the surface of the drift region rather than the entire drift region, which is generally used in super junction devices to improve breakdown characteristics simultaneity. The manufacturing process of the device is relatively simple and is compatible with the Bi-CMOS process. 3D device simulations indicate that the SLOP-LDMOS can provide a specific on-resistance reduction of 50% as compared with the conventional single reduced surface field (RESURF) LDMOS at a given breakdown voltage. An experimental LDMOS exhibited a breakdown voltage of 250 V, and a specific on-resistance of 11.4 Ωmm2. This is an early experimental report of the low on-resistance LDMOS with more than 200 V blocking capability by using the super junction concept.
Keywords
power MOSFET; semiconductor device breakdown; 250 V; Bi-CMOS process compatible; SLOP-LDMOS; breakdown voltage; drift region surface located super-junction; specific on-resistance; super-junction LDMOS; surface low on-resistance path lateral double-diffusion MOSFET; Charge carriers; Electric breakdown; MOSFETs; Manufacturing processes; Medical simulation; Silicon on insulator technology; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, Circuits and Systems, 2005. Proceedings. 2005 International Conference on
Print_ISBN
0-7803-9015-6
Type
conf
DOI
10.1109/ICCCAS.2005.1495367
Filename
1495367
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