DocumentCode :
1705741
Title :
Improved metrics in image processing applied to the Hilditch skeleton
Author :
Verwer, Ben J H
Author_Institution :
Fac. of Appl. Phys., Delft Univ. of Technol., Netherlands
fYear :
1988
Firstpage :
137
Abstract :
An algorithm is presented in which binary object pixels are addressed and processed in order of increasing distance from the background. The distances are defined as path lengths. The metric can be chosen to obtain arbitrarily good approximations of the Euclidean metric. The algorithm incorporates an efficient propagation method in which extensive use is made of directional information. It is applied to the Hilditch skeleton and proves to be as fast as the best of the other Hilditch skeletonization algorithms available in software
Keywords :
computerised pattern recognition; computerised picture processing; Euclidean metric; Hilditch skeleton; binary object pixels; computerised pattern recognition; computerised picture processing; image processing; path lengths; Biological cells; Euclidean distance; Image processing; Impedance matching; Pattern matching; Pattern recognition; Physics; Robot sensing systems; Skeleton; Software algorithms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 1988., 9th International Conference on
Conference_Location :
Rome
Print_ISBN :
0-8186-0878-1
Type :
conf
DOI :
10.1109/ICPR.1988.28189
Filename :
28189
Link To Document :
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