Title :
Nonvolatile logic-in-memory array processor in 90nm MTJ/MOS achieving 75% leakage reduction using cycle-based power gating
Author :
Natsui, Masanori ; Suzuki, Daisuke ; Sakimura, Noboru ; Nebashi, Ryusuke ; Tsuji, Yukihide ; Morioka, Ayuka ; Sugibayashi, Tadahiko ; Miura, Shun ; Honjo, Hiroaki ; Kinoshita, Keizo ; Ikeda, Shoji ; Endoh, Tetsuo ; Ohno, Hideo ; Hanyu, Takahiro
Author_Institution :
Tohoku Univ., Sendai, Japan
Abstract :
Nonvolatile logic-in-memory (NV-LIM) architecture [1], where magnetic tunnel junction (MTJ) devices [2] are distributed over a CMOS logic-circuit plane, has the potential of overcoming the serious power-consumption problem that has rapidly become a dominant constraint on the performance improvement of today´s VLSI processors. Normally-off and instant-on capabilities with a small area penalty due to non-volatility and three-dimensional-stackability of MTJ devices in the above structure allow us to apply a power-gating technique in a fine temporal granularity, which can perfectly eliminate wasted power dissipation due to leakage current. The impact of embedding nonvolatile memory devices into a logic circuit was, however, demonstrated by using only small fabricated primitive logic-circuit elements [3], memory-like structures such as FPGA [4], or circuit simulation because of the lack of an established MTJ-oriented design flow reflecting the chip-fabrication environment, while larger-capacity and/or high-speed-access MRAM has been increasingly developed. In this paper, we present an MTJ/MOS-hybrid video coding hardware that uses a cycle-based power-gating technique for a practical-scale MTJ-based NV-LIM LSI, which is fully designed using the established semi-automated MTJ-oriented design flow.
Keywords :
CMOS logic circuits; MRAM devices; VLSI; field programmable gate arrays; magnetic tunnelling; video coding; CMOS logic-circuit plane; FPGA; MTJ-MOS devices; MTJ-MOS-hybrid video coding hardware; NV-LIM architecture; VLSI processors; chip-fabrication environment; circuit simulation; cycle-based power-gating technique; high-speed-access MRAM; leakage current; leakage reduction; magnetic tunnel junction devices; memory-like structures; nonvolatile logic-in-memory array processor; nonvolatile memory devices; power-consumption problem; practical-scale MTJ-based NV-LIM LSI; primitive logic-circuit elements; semiautomated MTJ-oriented design flow; size 90 nm; three-dimensional-stackability; wasted power dissipation elimination; Arrays; CMOS integrated circuits; Junctions; Magnetic tunneling; Nonvolatile memory; Power supplies; Very large scale integration;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2013 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4673-4515-6
DOI :
10.1109/ISSCC.2013.6487696