DocumentCode :
1705797
Title :
A versatile timing microsystem based on wafer-level packaged XTAL/BAW resonators with sub-µW RTC mode and programmable HF clocks
Author :
Ruffieux, David ; Scolari, N. ; Giroud, F. ; Le, T.C. ; Piazza, S.D. ; Staub, F. ; Zoschke, K. ; Manier, C.A. ; Oppermann, H. ; Dekker, James ; Suni, T. ; Allegato, G.
Author_Institution :
CSEM, Neuchatel, Switzerland
fYear :
2013
Firstpage :
196
Lastpage :
197
Abstract :
Over recent years the several decades long quartz-dominated timing industry has been continuously challenged by the introduction of new products or demonstration of prototypes based on MEMS resonators [1-4]. The poor intrinsic stability of such devices has led to the development of very high performance temperature sensors to reach TCXO-level frequency stability [5]. One of the true advantages of the technology is the fact that well-proven semiconductor manufacturing technologies amenable for high volume production can be leveraged to produce wafer-level encapsulated low-cost components. This paper explores how XTAL resonators could benefit from similar wafer level, vacuum sealing packaging technologies with the demonstration of a generic versatile timing module.
Keywords :
acoustic resonators; bulk acoustic wave devices; clocks; frequency stability; micromechanical resonators; programmable circuits; seals (stoppers); wafer level packaging; MEMS resonators; RTC mode; TCXO-level frequency stability; generic versatile timing module; high volume production; long quartz-dominated timing industry; programmable HF clocks; semiconductor manufacturing technologies; vacuum sealing packaging technologies; versatile timing microsystem; very high performance temperature sensors; wafer-level encapsulated low-cost components; wafer-level packaged XTAL-BAW resonators; Application specific integrated circuits; Circuit stability; Clocks; Oscillators; Phase locked loops; Temperature sensors; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2013 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0193-6530
Print_ISBN :
978-1-4673-4515-6
Type :
conf
DOI :
10.1109/ISSCC.2013.6487697
Filename :
6487697
Link To Document :
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