DocumentCode :
1705889
Title :
Time-domain macromodel for nonuniform interconnect analysis
Author :
Izydorczyk, Jacek
Author_Institution :
Silesian Univ. of Technol., Gliwice, Poland
fYear :
2010
Firstpage :
598
Lastpage :
603
Abstract :
In this article a new method of nonuniform transmission line (NUTL) simulation is proposed. The method is patterned on asymptotic waveform evaluation (AWE). In this paper, the q-pole model is matched to imitate exact position of zeros and poles and values of residues of the poles of admittance matrix of the NUTL. The paper proposes to extend the lossless linear varied transmission line model by elements accounting the phenomenon of energy dissipation. To model the skin effect, author proposed a family of LR ladder circuits, which more and more closely approximate √(s) impedance. To describe dielectric loss the simplest model was used - the model utilizing only one time constant. The result is a line circuit model of nonuniform transmission line scattering energy. This model was verified by comparing the results of measurements of attenuation of RG-58U cable with the results of the Spice simulation.
Keywords :
SPICE; dielectric losses; electric admittance; electric impedance; integrated circuit interconnections; ladder networks; poles and zeros; semiconductor device models; transmission lines; LR ladder circuit; NUTL simulation; RG-58U cable; Spice simulation; admittance matrix; asymptotic waveform evaluation; attenuation measurement; dielectric loss; energy dissipation; impedance; line circuit model; lossless linear varied transmission line model; nonuniform interconnect analysis; nonuniform transmission line; q-pole model; scattering energy; skin effect; time-domain macromodel; zeros and poles; Approximation methods; Dielectric losses; Equations; Impedance; Integrated circuit modeling; Mathematical model; Skin effect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Technologies in Electrical and Electronics Engineering (SIBIRCON), 2010 IEEE Region 8 International Conference on
Conference_Location :
Listvyanka
Print_ISBN :
978-1-4244-7625-1
Type :
conf
DOI :
10.1109/SIBIRCON.2010.5555141
Filename :
5555141
Link To Document :
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