• DocumentCode
    1705890
  • Title

    Weighted random pattern testing based on test counts

  • Author

    Pitchumani, Vijay ; Narayanan, Vinod

  • Author_Institution
    Dept. of Electr. Comput. Eng., Syracuse Univ., NY, USA
  • fYear
    1988
  • Firstpage
    433
  • Abstract
    The authors present an algorithm to generate weighted random test patterns based on multiple probability distributions. The algorithm to generate distributions is based on S.B. Akers and B. Krishnamurthy´s test counting method, and has a running time which is linear in the number of gates. The algorithm has been implemented in C, and tested on several of the ISCAS benchmark circuits. The results are significantly superior to both pure random testing, and the weighted random pattern testing reported by R. Lisanke et al. (1986, 1987).<>
  • Keywords
    logic testing; probability; ISCAS benchmark circuits; multiple probability distributions; running time; test counts; weighted random pattern testing; weighted random test patterns; Benchmark testing; Circuit faults; Circuit testing; Fault detection; Logic testing; Performance evaluation; Probability distribution; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1988., IEEE International Symposium on
  • Conference_Location
    Espoo, Finland
  • Type

    conf

  • DOI
    10.1109/ISCAS.1988.14957
  • Filename
    14957
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1705890