DocumentCode
1705959
Title
On the Problems of Symbol-Spaced Tapped-Delay-Line Models for WSSUS Channels
Author
Gutiérrez-Díaz-de-León, Carlos A. ; Cabrera-Bean, Margarita ; Pätzold, Matthias
Author_Institution
Polytech. Univ. of Catalonia, Barcelona
fYear
2007
Firstpage
920
Lastpage
925
Abstract
This paper reviews the pertinence and statistical behavior of symbol-spaced tapped-delay-line (TDL) models which are widely used to model wide-sense stationary uncorrelated scattering (WSSUS) channels. Symbol-spaced TDL models are obtained by sampling the channel impulse response (CIR) at a rate equal to the reciprocal of the symbol duration. They were proposed more than three decades ago within the context of band-limited systems and their applicability seems to be unquestionable. Nonetheless, we show here that these TDL models should be used with care to model WSSUS channels within such a context, because that would violate the channel´s uncorrelated scattering (US) condition. We also show that symbol-spaced TDL models suffer from strong limitations in emulating the channel frequency correlation function (FCF). It is shown that this drawback leads to an inaccurate performance evaluation of wireless communication systems sensitive to the FCF. We discuss a simple solution to this problem by doubling the channel´s sampling rate. The advantages of this solution will be demonstrated by some numerical examples.
Keywords
statistical analysis; transient response; wireless channels; WSSUS channels; channel frequency correlation function; channel impulse response; performance evaluation; pertinence-statistical behavior; symbol-spaced tapped-delay-line models; wide-sense stationary uncorrelated scattering; wireless communication systems; Context modeling; Educational institutions; Frequency; Land mobile radio; Multicarrier code division multiple access; Multipath channels; Sampling methods; Scattering; Stochastic systems; Wireless communication;
fLanguage
English
Publisher
ieee
Conference_Titel
Vehicular Technology Conference, 2007. VTC-2007 Fall. 2007 IEEE 66th
Conference_Location
Baltimore, MD
ISSN
1090-3038
Print_ISBN
978-1-4244-0263-2
Electronic_ISBN
1090-3038
Type
conf
DOI
10.1109/VETECF.2007.201
Filename
4349850
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