• DocumentCode
    1705989
  • Title

    A new approach to test case generation based on real-time process algebra (RTPA)

  • Author

    Yao, Yizheng ; Wang, Yingxu

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Calgary Univ., Alta., Canada
  • Volume
    3
  • fYear
    2004
  • Firstpage
    1515
  • Abstract
    In order to detect and fix errors and bugs in software design and implementation, testing is a vital process in software engineering. It is recognized that testing a large-scale software system needs more intelligence and effort than code design and implementation do. The paper presents a new approach to specification-based test generation that enables test cases to be generated before the implementation of code. We adopt real-time process algebra (RTPA) to describe software system architectures, static and dynamic behaviors. Based on RTPA, a method of least completed set of tests (LCST) is developed, which reveals that the sufficient number of tests for a given software is O(4n), where n is the number of the input variables. The LCST method provides a new way to predict how many independent test cases exist for a given program, and how the tests may be generated on the basis of its RTPA specifications. Experimental case studies on applications of the LCST method are reported that demonstrate the usage and efficiency of this new method.
  • Keywords
    conformance testing; process algebra; program debugging; program testing; software architecture; software reliability; dynamic behavior; least completed set of tests method; real-time process algebra; software bugs; software design; software engineering; software errors; software system architectures; software testing; specification-based test generation; static behavior; test case generation; Algebra; Computer bugs; Intelligent systems; Large-scale systems; Real time systems; Software design; Software engineering; Software systems; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering, 2004. Canadian Conference on
  • ISSN
    0840-7789
  • Print_ISBN
    0-7803-8253-6
  • Type

    conf

  • DOI
    10.1109/CCECE.2004.1349694
  • Filename
    1349694