Title :
Future waferlevel CSP packaging
Author_Institution :
Dept. Mech. Reliability & Micro Mater., Fraunhofer Inst. Reliability & Microintegration Berlin, Germany
Abstract :
The requirements for wafer-level CSP technology concerning reliability and cost are discussed. A simple cost calculation based on cost per I/O for single chip packaging demonstrates the advantage of wafer-level CSP-type packaging and gives a cost limit for wafer-level packaging technologies. The geometrical limitations are noted. The reliability requirements for successful implementation are described. A wafer-level packaging concept called Diepack is used to study the requirements for wafer-level packaging. It is shown that wafer-level CSP-type packaging can be achieved with "simple" technologies for small dice.
Keywords :
chip scale packaging; cost-benefit analysis; integrated circuit reliability; Diepack wafer-level packaging; cost calculation; cost per I/O; geometrical limitations; packaging cost; reliability; single chip packaging; wafer-level CSP technology; wafer-level CSP-type packaging; wafer-level packaging technology; wafer-level packaging technology cost limit; Assembly; Chip scale packaging; Components, packaging, and manufacturing technology; Costs; Flip chip; Manufacturing processes; Materials reliability; Semiconductor device packaging; Silicon; Stress;
Conference_Titel :
IEMT/IMC Symposium, 2nd 1998
Conference_Location :
Tokyo, Japan
Print_ISBN :
0-7803-5090-1
DOI :
10.1109/IEMTIM.1998.704504