DocumentCode :
170631
Title :
Keyed logic BIST for Trojan detection in SoC
Author :
Dubrova, Elena ; Naslund, Mats ; Carlsson, Gunnar ; Smeets, Bart
Author_Institution :
Sch. of ICT, R. Inst. of Technol., Stockholm, Sweden
fYear :
2014
fDate :
28-29 Oct. 2014
Firstpage :
1
Lastpage :
4
Abstract :
As demonstrated by the recent attack on Intel´s Ivy Bridge processor, the traditional Logic Built-In Self-Test (LBIST) methods do not provide adequate protection of SoC against malicious modifications known as hardware Trojans. In this paper, we introduce a simple but efficient countermeasure against hardware Trojans which exploits non-zero aliasing probability of LBIST. We propose to generate LBIST test patterns based on a configurable key which is decided and programed into the circuit after the manufacturing stage. Since the key and hence expected LBIST signature are unknown at the manufacturing stage, an attack based on selecting suitable values for the Trojan which result in the same signature as a fault-free circuit signature becomes infeasible.
Keywords :
built-in self test; cryptography; invasive software; microprocessor chips; system-on-chip; Intel; Ivy Bridge processor; LBIST test patterns; SoC; Trojan detection; cryptographic method; fault-free circuit signature; hardware Trojans; keyed logic BIST; logic built-in self-test method; nonzero aliasing probability; system-on-chip; Built-in self-test; Circuit faults; Cryptography; Hardware; Manufacturing; System-on-chip; Trojan horses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
System-on-Chip (SoC), 2014 International Symposium on
Conference_Location :
Tampere
Type :
conf
DOI :
10.1109/ISSOC.2014.6972433
Filename :
6972433
Link To Document :
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