DocumentCode
1706687
Title
All-digital hybrid temperature sensor network for dense thermal monitoring
Author
Seungwook Paek ; Wongyu Shin ; Jaeyoung Lee ; Hyo-Eun Kim ; Jun-Seok Park ; Lee-Sup Kim
Author_Institution
KAIST, Daejeon, South Korea
fYear
2013
Firstpage
260
Lastpage
261
Abstract
Technology scaling and many-core design trends demand detailed information regarding the spatial temperature distribution, which is essential for dynamic thermal management [1,2]. The number of on-chip temperature sensors in high-performance processors is increasing, with state-of-the-art commercial processors embedding up to 44 on-chip sensors [3] and the number is likely to increase in the future (Fig. 14.7.1(a)). We observe two significant challenges in on-chip temperature sensing: 1) the increasing number of sensors, and 2) placing them in a regular manner (not solely on the potential hotspots). The number of sensors is mostly constrained by their area. Indeed, the sensor area is difficult to shrink since large delay lines or a BJT with a large ADC, and digital circuits are required to generate a proportional-to-absolute-temperature (PTAT) signal [2,5,6]. Many-core processor architectures give rise to the second challenge, namely, the hotspot locations within many-core processors are difficult to predict since we cannot determine the task allocation (and heat) profile at design time [2]. Consequently, an area-efficient dense thermal monitoring technique is desirable for next-generation processors.
Keywords
analogue-digital conversion; delay lines; multiprocessing systems; temperature distribution; temperature sensors; thermal management (packaging); ADC; BJT; PTAT signal; all-digital hybrid temperature sensor network; area-efficient dense thermal monitoring technique; delay line; digital circuit; dynamic thermal management; heat profile; high-performance processor; hotspot location; many-core design; many-core processor architecture; next-generation processor; on-chip sensor; on-chip temperature sensing; on-chip temperature sensor; proportional-to-absolute-temperature; sensor area; spatial temperature distribution; task allocation; technology scaling; Clocks; Program processors; Temperature distribution; Temperature measurement; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2013 IEEE International
Conference_Location
San Francisco, CA
ISSN
0193-6530
Print_ISBN
978-1-4673-4515-6
Type
conf
DOI
10.1109/ISSCC.2013.6487726
Filename
6487726
Link To Document