Title :
Fault resilient physical neural networks on a single chip
Author :
Weidong Shi ; Yuanfeng Wen ; Ziyi Liu ; Xi Zhao ; Boumber, Dainis ; Vilalta, Ricard ; Lei Xu
Author_Institution :
Univ. of Houston Houston, Houston, TX, USA
Abstract :
Device scaling engineering is facing major challenges in producing reliable transistors for future electronic technologies. With shrinking device sizes, the total circuit sensitivity to both permanent and transient faults has increased significantly. Research for fault tolerant processors has primarily focused on the conventional processor architectures. Neural network computing has been employed to solve a wide range of problems. This paper presents a design and implementation of a physical neural network that is resilient to permanent hardware faults. To achieve scalability, it uses tiled neuron clusters where neuron outputs are efficiently forwarded to the target neurons using source based spanning tree routing. To achieve fault resilience in the face of increasing number of permanent hardware failures, the design proactively preserves neural network computing performance by selectively replicating performance critical neurons. Furthermore, the paper presents a spanning tree recovery solution that mitigates disruption to distribution of neuron outputs caused by failed neuron clusters. The proposed neuron cluster design is implemented in Verilog. We studied the fault resilience performance of the described design using a RBM neural network trained for classifying handwritten digit images. Results demonstrate that our approach can achieve improved fault resilience performance by replicating only 5% most important neurons.
Keywords :
fault diagnosis; hardware description languages; microprocessor chips; network routing; neural chips; trees (mathematics); RBM neural network; Verilog; device scaling engineering; device sizes shrinking; electronic technologies; fault resilience performance; fault resilient physical neural networks; fault tolerant processors; handwritten digit images classification; neural network computing; neuron outputs; performance critical neurons; permanent hardware failures; permanent hardware faults; processor architectures; single chip; source based spanning tree routing; spanning tree recovery solution; tiled neuron clusters; total circuit sensitivity; transient faults; transistors; Circuit faults; Hardware; Neural networks; Neurons; Probes; Routing; Transient analysis;
Conference_Titel :
Compilers, Architecture and Synthesis for Embedded Systems (CASES), 2014 International Conference on
Conference_Location :
Jaypee Greens
DOI :
10.1145/2656106.2656126