DocumentCode
1707304
Title
All digital baseband 50 Mbps data recovery using 5× oversampling with 0.9 data unit interval clock jitter tolerance
Author
Bushnaq, Sanad ; Nakura, Toru ; Ikeda, Makoto ; Asada, Kunihiro
Author_Institution
Electron. Eng., Univ. of Tokyo, Tokyo
fYear
2009
Firstpage
206
Lastpage
209
Abstract
In this paper, an all digital baseband data recovery algorithm using oversampling technique is presented. Our algorithm uses 5times clock to sample incoming data once around the middle. Sampling occurs exactly on the third clock after a data edge. If no data edge sensed, sampling occurs after five clocks from the previous sample. The system is designed to receive 50 Mbps data bit rate and uses a 250 MHz local clock to do the oversampling process. After injecting the clock with jitter at various magnitudes and frequencies, the design showed around 0.9 data Unit Interval (UIdata) jitter tolerance at frequencies higher than 25 MHz, in addition to a low Bit Error Rate (BER < 10-11). The setup is implemented on an Altera Stratix II GX Field Programmable Gate Array (FPGA) while Agilent 81250 parallel Bit Error Ratio Tester (parBERT) is used to measure BER using Pseudo Random Bit Sequences (PRBS). Using 0.18 mum CMOS process, the design consumes as low power as 5 muW, which makes it effective for low power applications such as wireless image sensor nodes.
Keywords
CMOS digital integrated circuits; clocks; error statistics; field programmable gate arrays; jitter; 0.9 data unit Interval clock jitter tolerance; Agilent 81250 parallel bit error ratio tester; Altera Stratix II GX field programmable gate array; CMOS process; FPGA; all digital baseband data recovery algorithm; bit rate 50 Mbit/s; frequency 250 MHz; low power applications; oversampling; power 5 muW; pseudo random bit sequences; size 0.18 mum; Baseband; Bit error rate; Bit rate; CMOS process; Clocks; Field programmable gate arrays; Frequency; Jitter; Sampling methods; Testing; data recovery; jitter injection; jitter tolerance; oversampling;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits & Systems, 2009. DDECS '09. 12th International Symposium on
Conference_Location
Liberec
Print_ISBN
978-1-4244-3341-4
Electronic_ISBN
978-1-4244-3340-7
Type
conf
DOI
10.1109/DDECS.2009.5012129
Filename
5012129
Link To Document