• DocumentCode
    1707304
  • Title

    All digital baseband 50 Mbps data recovery using 5× oversampling with 0.9 data unit interval clock jitter tolerance

  • Author

    Bushnaq, Sanad ; Nakura, Toru ; Ikeda, Makoto ; Asada, Kunihiro

  • Author_Institution
    Electron. Eng., Univ. of Tokyo, Tokyo
  • fYear
    2009
  • Firstpage
    206
  • Lastpage
    209
  • Abstract
    In this paper, an all digital baseband data recovery algorithm using oversampling technique is presented. Our algorithm uses 5times clock to sample incoming data once around the middle. Sampling occurs exactly on the third clock after a data edge. If no data edge sensed, sampling occurs after five clocks from the previous sample. The system is designed to receive 50 Mbps data bit rate and uses a 250 MHz local clock to do the oversampling process. After injecting the clock with jitter at various magnitudes and frequencies, the design showed around 0.9 data Unit Interval (UIdata) jitter tolerance at frequencies higher than 25 MHz, in addition to a low Bit Error Rate (BER < 10-11). The setup is implemented on an Altera Stratix II GX Field Programmable Gate Array (FPGA) while Agilent 81250 parallel Bit Error Ratio Tester (parBERT) is used to measure BER using Pseudo Random Bit Sequences (PRBS). Using 0.18 mum CMOS process, the design consumes as low power as 5 muW, which makes it effective for low power applications such as wireless image sensor nodes.
  • Keywords
    CMOS digital integrated circuits; clocks; error statistics; field programmable gate arrays; jitter; 0.9 data unit Interval clock jitter tolerance; Agilent 81250 parallel bit error ratio tester; Altera Stratix II GX field programmable gate array; CMOS process; FPGA; all digital baseband data recovery algorithm; bit rate 50 Mbit/s; frequency 250 MHz; low power applications; oversampling; power 5 muW; pseudo random bit sequences; size 0.18 mum; Baseband; Bit error rate; Bit rate; CMOS process; Clocks; Field programmable gate arrays; Frequency; Jitter; Sampling methods; Testing; data recovery; jitter injection; jitter tolerance; oversampling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits & Systems, 2009. DDECS '09. 12th International Symposium on
  • Conference_Location
    Liberec
  • Print_ISBN
    978-1-4244-3341-4
  • Electronic_ISBN
    978-1-4244-3340-7
  • Type

    conf

  • DOI
    10.1109/DDECS.2009.5012129
  • Filename
    5012129