DocumentCode :
1707592
Title :
Self-timed thermal sensing and monitoring of multicore systems
Author :
Vaddina, Kameswar Rao ; Nigussie, Ethiopia ; Liljeberg, Pasi ; Plosila, Juha
Author_Institution :
Dept. of Inf. Technol., Univ. of Turku, Turku
fYear :
2009
Firstpage :
246
Lastpage :
251
Abstract :
As the number of cores increases thermal challenges increase, thereby degrading the performance and reliability of the system. We approach this challenge with a self-timed thermal monitoring method which is based on the use of thermal sensors. Since leakage currents are sensitive to temperature and increase with scaling, we propose the use of a leakage current based thermal sensing for monitoring purposes. In this work we have implemented a novel thermal sensing circuit in 65 nm CMOS technology, which converts analog temperature information into digital form. We have also proposed a novel thermal sensing and monitoring interconnection network structure based on self-timed signaling, comprising of an encoder/transmitter and decoder/ receiver. We have performed power supply noise, additive noise on sensor input signal and dynamic power supply voltage variation analysis on the thermal sensing circuit and show that it is robust enough under different operating temperatures.
Keywords :
CMOS integrated circuits; temperature sensors; thermal variables measurement; CMOS technology; leakage current; multicore systems; self timed thermal sensing; size 65 nm; Additive noise; CMOS technology; Circuits; Leakage current; Monitoring; Multicore processing; Power supplies; Temperature sensors; Thermal degradation; Thermal sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems, 2009. DDECS '09. 12th International Symposium on
Conference_Location :
Liberec
Print_ISBN :
978-1-4244-3341-4
Electronic_ISBN :
978-1-4244-3340-7
Type :
conf
DOI :
10.1109/DDECS.2009.5012139
Filename :
5012139
Link To Document :
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