DocumentCode :
1707768
Title :
TTTC: Test Technology Technical Council
fYear :
2009
Firstpage :
282
Lastpage :
284
Abstract :
Provides a listing of current committee members and society officers.
Keywords :
Technical Councils; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems, 2009. DDECS '09. 12th International Symposium on
Conference_Location :
Liberec
Print_ISBN :
978-1-4244-3341-4
Type :
conf
DOI :
10.1109/DDECS.2009.5012146
Filename :
5012146
Link To Document :
بازگشت