DocumentCode
1707826
Title
A theory of RF window failure
Author
Valgells, A. ; Ang, L.K. ; Lau, Y.Y. ; Gilgenbach, Ronald M. ; Kishek, Rami A. ; Verboncoeur, John ; Neuber, A. ; Krompholz, H. ; Hatfield, L.L.
Author_Institution
Dept. of Nucl. Eng. & Radiol. Sci., Michigan Univ., Ann Arbor, MI, USA
fYear
1999
Firstpage
105
Abstract
Summary form only given, as follows. We have recently developed a novel theory of multipactor discharge on a dielectric. The main results include the susceptibility diagram and the prediction that about one percent of the RF power is deposited to the dielectric surface over a wide range of conditions. In this paper, we extend the analysis to include the effects of outgassing and the subsequent ionization by the multipactoring electrons. This is an attempt to understand the final stage of dielectric failure that is initiated by multipactor. Similarities and differences in such failures, under RF and DC conditions, are explored. Analytic theory and simulation results will be presented and compared with experiments.
Keywords
dielectric materials; discharges (electric); RF power deposition; RF window failure theory; analytic theory; dielectric; dielectric surface; ionization; multipactor discharge; simulation; susceptibility diagram; Analytical models; Dielectrics; Educational institutions; Electrons; Ionization; Power engineering and energy; Radio frequency; Surface discharges; US Department of Energy; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1999. ICOPS '99. IEEE Conference Record - Abstracts. 1999 IEEE International Conference on
Conference_Location
Monterey, CA, USA
ISSN
0730-9244
Print_ISBN
0-7803-5224-6
Type
conf
DOI
10.1109/PLASMA.1999.829310
Filename
829310
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