Title :
Improved impedance spectroscopy technique for status determination of production Li/SO3 batteries
Author :
Atwater, Terrill ; Gaetano, Kara ; Kanaris, Christopher
Author_Institution :
US Army Electron. Technol. & Devices Lab., Fort Monmouth, NJ, USA
Abstract :
The authors address the development of a technique to provide reliable two-terminal impedance measurements on graduation cells. The technique´s value as a quality control tool and field tester were criteria during its development. Accuracy and measurement time are two areas of concern. An impedance spectroscopy measurement system was set up using a Hewlett Packard HP9836 computer with hard drive and printer, a Schlumberger I286 electrochemical interface and a Schlumberger I250 frequency response analyzer. Since the concentration was on two terminal cells the working electrode of the electrochemical interface was connected to reference electrode 2 and the counter electrode was connected to reference electrode 1. Routine impedance measurements have been made on lithium/sulphur dioxide (Li/SO2) cells using an equivalent electric circuit approach. The data obtained show that network analysis for production batteries can be achieved quickly and accurately
Keywords :
automatic test equipment; automatic testing; electrochemical electrodes; electrochemistry; equivalent circuits; lithium; primary cells; quality control; sulphur compounds; ATE; HP9836 computer; Hewlett Packard; I250 frequency response analyzer; Li-SO2 primary cells; QC; Schlumberger I286 electrochemical interface; automatic testing; development; electrochemical interface; electrode; equivalent electric circuit; graduation cells; hard drive; impedance spectroscopy; network analysis; printer; production batteries; quality control; two-terminal impedance measurements; Area measurement; Computer interfaces; Drives; Electrochemical impedance spectroscopy; Electrodes; Frequency measurement; Impedance measurement; Quality control; Testing; Time measurement;
Conference_Titel :
Power Sources Symposium, 1992., IEEE 35th International
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-7803-0552-3
DOI :
10.1109/IPSS.1992.282017