Title :
A novel ultra wide band Radar Absorber based on hexagonal resistive patch FSS
Author :
Sudhendra, Chandrika ; Madhu, A.R. ; Pillai, Acr ; Kark, Rao ; Rukmini, Ts.
Author_Institution :
Appl. Res. Div., Aeronaut. Dev. Establ., Defence R&D Organ., Bangalore, India
Abstract :
Design and development of a novel Ultra Wide Band (UWB) panel Radar Absorbing Material (RAM) with Radar Cross Section Reduction (RCSR) of 10 dB (minimum) from 1.7 GHz. to 25 GHz. using hexagonal resistive patch Frequency Selective Surface (FSS) is presented in this paper. The four layers RAM is analyzed using transmission line model (TLM) and full-wave analysis of the design is carried out using HFSS v15 simulation software. The resistive FSS layers are designed as electrically very thin PCBs using 0.2 mm thick FR4 substrate. The prototype RAM is developed as a panel of size (280 mm × 280 mm). The thickness of panel RAM is 16.8 mm. and the weight is 190 gm. Monostatic RCS measurements are carried out on RAM in microwave anechoic chamber. Experimental and simulation results agree very well.
Keywords :
SRAM chips; anechoic chambers (electromagnetic); electromagnetic wave absorption; frequency selective surfaces; microstrip antennas; microwave materials; printed circuits; radar antennas; radar cross-sections; resistive RAM; telecommunication transmission lines; ultra wideband antennas; ultra wideband radar; FR4 substrate; HFSS v15 simulation software; RAM; RCSR; TLM; UWB panel radar absorbing material; electrically very thin PCB; frequency 1.7 GHz to 25 GHz; frequency selective surface; full-wave analysis; hexagonal resistive patch FSS; microwave anechoic chamber; monostatic RCS measurement; radar cross section reduction; size 0.2 mm; size 16.8 mm; transmission line model; ultra wideband radar absorber; Analytical models; Dielectrics; Frequency selective surfaces; Microwave measurement; Radar cross-sections; Random access memory; FSS; Jauman absorber; RAM; RCS; RCSR;
Conference_Titel :
Applied Electromagnetics Conference (AEMC), 2013 IEEE
Conference_Location :
Bhubaneswar
Print_ISBN :
978-1-4799-3266-5
DOI :
10.1109/AEMC.2013.7045118
