Spherically curved crystals for X-ray plasma diagnostics

Author

Aglitskiy, Yefim ; Lehecka, T. ; Obenschain, S. ; Pawley, C. ; Brown, Cordelia M. ; Seely, John

Author_Institution

Sci. Applications Int. Corp., McLean, VA, USA

fYear

1999

Firstpage

129

Abstract

Summary form only given. We report on our continued development of the X-ray plasma diagnostics based on spherically curved crystals. The diagnostics include X-ray spectroscopy with 1D spatial resolution and 2D monochromatic self-imaging and backlighting. The system is currently used, but not limited to diagnostics of the targets ablatively accelerated by the NRL Nike KrF laser.

Keywords

Stark effect; X-ray optics; X-ray spectroscopy; mica; plasma diagnostics; quartz; spectral line broadening; time resolved spectra; 1D spatial resolution; 2D monochromatic self-imaging; CH planar targets; NRL Nike KrF laser; X-ray optical system; X-ray plasma diagnostics; X-ray spectroscopy; ablatively accelerated targets; backlighting; developing instabilities; focal spots; four-strip X-ray framing camera; low density foam targets; mica; plasma instability development; quartz crystal; spatial resolution; spherically curved crystals; Cameras; Crystals; Laboratories; Optical imaging; Plasma applications; Plasma diagnostics; Resonance; Spatial resolution; X-ray imaging; X-ray lasers;

fLanguage

English

Publisher

ieee

Conference_Titel

Plasma Science, 1999. ICOPS '99. IEEE Conference Record - Abstracts. 1999 IEEE International Conference on

Conference_Location

Monterey, CA, USA

ISSN

0730-9244

Print_ISBN

0-7803-5224-6

Type

conf

DOI

10.1109/PLASMA.1999.829353

Filename

829353