• DocumentCode
    1709077
  • Title

    Characteristics of charge accumulation in glass materials under electron beam irradiation

  • Author

    Miyake, H. ; Tanaka, Y. ; Takada, T. ; Liu, R.

  • Author_Institution
    Lab. of Electron. Meas., Musashi Inst. of Technol., Tokyo, Japan
  • Volume
    1
  • fYear
    2005
  • Firstpage
    49
  • Abstract
    Space charge formation in various glass materials under electron beam irradiation was investigated. Charging of spacecraft occurs in plasma and radiation environment. Especially, we focused on an accident caused by internal charging in a glass material that was used as the cover plate of solar panel array, and tried to measure the charge distribution in glass materials under electron beam irradiation by using a PEA (pulsed electro-acoustic method) system. In the case of a quartz glass (pure SiO2), no charge accumulation was observed either during or after the electron beam irradiation. On the contrary, positive charge accumulation was observed in glass samples containing metal-oxide components. It is found that the polarity of the observed charges depends on the contents of the impurities. To identify which impurity dominates the polarity of the accumulated charge, we measured charge distributions in several glass materials containing various metal-oxide components and calculated the trap energy depths from the charge decay characteristics of all glass samples. Furthermore, the dependence of the polarity of accumulated charges on the component of glass materials is discussed by using the models of energy bands.
  • Keywords
    accumulation layers; electron beam applications; glass; pulsed electroacoustic methods; space charge; charge decay characteristics; electron beam irradiation; glass materials; internal charging accident; metal-oxide components; pulsed electroacoustic method; solar panel array; space charge formation; spacecraft charging; Aircraft manufacture; Charge measurement; Current measurement; Electron beams; Glass; Impurities; Plasma materials processing; Plasma measurements; Plasma properties; Space charge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulating Materials, 2005. (ISEIM 2005). Proceedings of 2005 International Symposium on
  • Print_ISBN
    4-88686-063-X
  • Type

    conf

  • DOI
    10.1109/ISEIM.2005.193321
  • Filename
    1496042