• DocumentCode
    1709152
  • Title

    Complex permittivity measurement in dielectric waveguide filled with argon plasma

  • Author

    Motta, C.C. ; Fonseca, A.D. ; Gomes, G.H. ; Maciel, H.S.

  • Author_Institution
    Centro Tecnologico da Marinha, Sao Paulo, Brazil
  • Volume
    1
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    273
  • Abstract
    An experimental set-up to measure the standing wave pattern of dielectric waveguide filled with low pressure plasma has been developed and is reported in this paper. Through the analysis of this pattern together with a solution of the complex algebra dispersion equation, a method is developed to determine the complex plasma permittivity that fills the dielectric waveguide. The experimental apparatus to measure the standing wave pattern of surface wave consists of a coaxial electric probe mounted in a moving carriage. The output signal of the probe is connected to a microwave detector and this output is a measurement of the relative electric field of the axial probe position around the dielectric waveguide. The microwave energy that sustains the plasma comes from a rectangular resonator excited by a quasi-CW magnetron. In the resonator there is a suitable pair of sleeves that launch the microwave energy stored in the dielectric waveguide. For 2.45 GHz and 750W of microwave power input a complex relative permittivity of (8.7-j15.8)×10-3 is found.
  • Keywords
    dielectric waveguides; dispersion (wave); microwave detectors; microwave measurement; permittivity measurement; plasma filled waveguides; rectangular waveguides; 2.45 GHz; 750 W; coaxial electric probe; complex algebra dispersion equation; complex permittivity measurement; complex plasma permittivity; dielectric waveguide; low pressure plasma; microwave detector; moving carriage; output signal; plasma filled waveguide; quasi-CW magnetron; rectangular resonator; standing wave pattern; Argon; Dielectric measurements; Electric variables measurement; Magnetic field measurement; Pattern analysis; Permittivity measurement; Plasma measurements; Plasma waves; Pressure measurement; Probes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Optoelectronics Conference, 2001. IMOC 2001.Proceedings of the 2001 SBMO/IEEE MTT-S International
  • Print_ISBN
    0-7803-7065-1
  • Type

    conf

  • DOI
    10.1109/SBMOMO.2001.1008764
  • Filename
    1008764