An injection-locked-oscillator phase discriminator for RF built-in self test on local oscillator phase noise

The analysis, design, and implementation of an RF built-in self-test (BIST) bench on local oscillator phase noise are presented. An injection-locked-oscillator phase discriminator integrated with a 2.56GHz phase-locked loop in 65nm CMOS is proposed in this bench. The proposed phase discriminator occupies an area of 0.38 mm×0.38 mm and consumes 3.8 mW of power. The RF-BIST bench provides the phase noise profile with 1.5dB, 1.4dB, and 2.7dB errors at 100kHz, 1MHz, and 10MHz offset frequencies respectively.