Title :
A wide-bandwidth W-band LNA in InP/Si BiCMOS technology
Author :
Watson, Paul ; Mattamana, A. ; Gilbert, R. ; Royter, Yakov ; Lau, Mogens ; Valles, Irma ; Li, Jie
Author_Institution :
Sensors Directorate, Air Force Res. Lab., Wright-Patterson AFB, OH, USA
Abstract :
This paper presents the development of high-gain, wide-bandwidth, W-band LNA integrated circuits utilizing a novel 0.25 μm InP/Si BiCMOS process with Ft/Fmax of 330/270 GHz. A 4-stage microstrip LNA achieves a minimum NF of 5.7 dB at 92 GHz and remains less than 7.2 dB (6.4 dB avg.) across a 75-100 GHz bandwidth. The LNA also exhibits a peak gain of 27.7 dB, a 3-dB bandwidth of 18 GHz (80-98 GHz), gain > 20 dB over 75-110 GHz, while consuming only 19.2 mW of DC power from a 1.2V supply. Additionally, individual bias control for each device has been incorporated to vary gain, including a version with two 3-bit current steering DACs to control base currents. The 0.42 mm2 (w/o pads) LNA is suitable for many emerging W-band applications including radar, communications, and imaging and provides superior performance compared to published LNAs developed in available SiGe BiCMOS technologies.
Keywords :
BiCMOS integrated circuits; III-V semiconductors; elemental semiconductors; field effect MIMIC; indium compounds; low noise amplifiers; microstrip circuits; millimetre wave amplifiers; silicon; 4-stage microstrip LNA; BiCMOS technology; InP-Si; bandwidth 18 GHz; bandwidth 75 GHz to 100 GHz; base current control; bias control; current steering DACs; frequency 270 GHz; frequency 330 GHz; frequency 80 GHz to 98 GHz; frequency 92 GHz; high-gain wide-bandwidth W-band LNA integrated circuits; size 0.25 mum; voltage 1.2 V; wide-bandwidth W-band LNA; word length 3 bit; BiCMOS integrated circuits; Gain; Imaging; Indium phosphide; Laboratories; Noise measurement; Silicon; BiCMOS; InP; LNA; Silicon; W-band;
Conference_Titel :
Microwave Symposium (IMS), 2014 IEEE MTT-S International
Conference_Location :
Tampa, FL
DOI :
10.1109/MWSYM.2014.6848249