Title :
Spectroscopic studies of emissions from microhollow cathode discharges
Author :
Kurunczi, P. ; Becker, Kurt ; Schoenbach, Karl H.
Author_Institution :
Stevens Inst. of Technol., Hoboken, NJ, USA
Abstract :
Summary form only given. Conventional hollow cathode discharges are typically operated at pressures ranging from mTorr to Torr. Operation at higher pressures (up to atmospheric pressure) is possible, if the hole diameter is reduced to dimensions of about 100 /spl mu/m with a corresponding reduction in the cathode-anode gap (microhollow cathode discharge). A microhollow cathode discharge (MHCD) operated at high (atmospheric) pressure is a simple, compact, and efficient sources of radiation such as rare gas excimer emissions. The conditions in a MHCD satisfy the two criteria necessary for excimer formation, (i) a sufficiently large number of energetic electrons and (ii) pressures high enough that three-body collisions occur with sufficient frequency. We have started a series of spectroscopic studies of emissions from MHCDs in the rare gases Xe, Ar, and Ne as well as in molecular nitrogen and air aimed (i) at elucidating the basic collision and relaxation processes in a MHCD and (ii) at obtaining a rudimentary understanding of the electron, neutral and ion temperatures in MHCDs under various operating conditions (pressure, current, electrode geometry, and hole size).
Keywords :
fluorescence; glow discharges; plasma collision processes; plasma diagnostics; plasma pressure; plasma temperature; time resolved spectra; 100 mum; Ar; N/sub 2/; Ne; Xe; air; atmospheric pressure; cathode-anode gap; collision processes; current; electrode geometry; electron temperature; emissions; energetic electrons; excimer formation; hole diameter; hole size; hollow cathode discharges; ion temperatures; microhollow cathode discharge; microhollow cathode discharges; neutral temperature; operating conditions; pressure; pressures; rare gas excimer emissions; rare gases; relaxation processes; spectroscopic studies; three-body collisions; Argon; Cathodes; Charge carrier processes; Electron emission; Fault location; Frequency; Gases; Nitrogen; Spectroscopy; Temperature;
Conference_Titel :
Plasma Science, 1999. ICOPS '99. IEEE Conference Record - Abstracts. 1999 IEEE International Conference on
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-5224-6
DOI :
10.1109/PLASMA.1999.829382