• DocumentCode
    1709456
  • Title

    Side-extraction-type secondary-emission electron gun using wire ion plasma source

  • Author

    Ishikawa, M. ; Kanbe, N. ; Okino, A. ; Kwang-Cheol Ko ; Hotta, E.

  • Author_Institution
    Dept. of Energy Sci., Tokyo Inst. of Technol., Yokohama, Japan
  • fYear
    1999
  • Firstpage
    144
  • Abstract
    Summary form only given, as follows. A wire ion plasma source (WIPS) is a compact ion source, which consists of a central thin wire anode and a grounded coaxial cathode. The cathode also acts as a vacuum chamber. The configuration allows the initiation of low-pressure gas discharge only by applying voltage of several hundreds on the anode by virtue of the geometrical electron confinement. A secondary emission electron gun is set beside the WIPS. The electrode set in the gun is highly negative-biased. Ions extracted from the WISP through a grid are accelerated toward the electrode and they collide on its surface with high kinetic energy, which corresponds to the electrode bias voltage. By collision of ions, secondary electrons are emitted from the electrode surface. The emitted electrons are then accelerated toward the extraction window and form a very wide electron beam. The extraction window is set on the side orthogonal to the ion extraction grid and is on earth potential. In this configuration, the accelerating potential distribution is considerably different from that of the plane parallel electrode configuration and it affects the extraction of the electron beam. Therefore, the loci of electrons and the current distribution of beam at the extraction window are computed and compared with the experimental results.
  • Keywords
    anodes; cathodes; discharges (electric); electron beams; electron guns; ion sources; plasma production; plasma-wall interactions; secondary electron emission; WIPS; accelerating potential distribution; central thin wire anode; compact ion source; configuration; current distribution; earth potential; electrode bias voltage; electrode surface; electron beam; emitted electrons; experimental results; extraction window; geometrical electron confinement; grounded coaxial cathode; ion collision; ion extraction grid; kinetic energy; low-pressure gas discharge; negative-biased electrode; plane parallel electrode configuration; secondary electrons; secondary emission electron gun; side-extraction-type secondary-emission electron gun; vacuum chamber; wide electron beam; wire ion plasma source; Acceleration; Anodes; Cathodes; Electrodes; Electron beams; Electron emission; Ion sources; Plasma sources; Voltage; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1999. ICOPS '99. IEEE Conference Record - Abstracts. 1999 IEEE International Conference on
  • Conference_Location
    Monterey, CA, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-5224-6
  • Type

    conf

  • DOI
    10.1109/PLASMA.1999.829383
  • Filename
    829383