Title :
Finite element analysis of thermo-optic integrated photonic devices
Author :
Sircilli, Francisco ; Franco, Marcos A R ; Passaro, Angelo ; Abe, Nancy M.
Author_Institution :
Centro Tecnico Aeroespacial CTA/IEAv, Brazil
fDate :
6/23/1905 12:00:00 AM
Abstract :
Integrated photonic devices are particularly sensitive to temperature variations. This work describes a numerical approach to evaluate the influence of the optical waveguide beating on the wave propagation properties. The finite element method (FEM) was used to perform both the stationary and linear thermal analysis and the optical modal studies. The refractive index profiles of Ti:LiNbO3 waveguide, as a function of fabrication parameters are taken into account employing an analytical solution of the 2D linear-stationary diffusion equation. The thermo-optic effect changes the refractive indexes at the waveguide region. The refractive indexes variation can be evaluated by using a model based on experimental data. Finally, the modal analyzes of Ti:LiNbO3 waveguides perturbed by the thermo-optic effect were performed. Two devices were studied: a thermo-optic phase shift modulator and a thermo-optically induced waveguide switch (cutoff switch).
Keywords :
finite element analysis; integrated optics; lithium compounds; optical modulation; optical switches; phase modulation; refractive index; thermal analysis; thermo-optical effects; 2D linear-stationary diffusion equation; LiNbO3:Ti; Ti:LiNbO3 waveguide; fabrication parameters; finite element analysis; linear thermal analysis; optical waveguide heating; phase shift modulator; stationary thermal analysis; temperature variations; thermo-optic integrated photonic devices; thermo-optically induced waveguide switch; wave propagation properties; Finite element methods; Optical refraction; Optical sensors; Optical variables control; Optical waveguides; Performance analysis; Refractive index; Switches; Thermooptic effects; Thermooptical devices;
Conference_Titel :
Microwave and Optoelectronics Conference, 2001. IMOC 2001.Proceedings of the 2001 SBMO/IEEE MTT-S International
Print_ISBN :
0-7803-7065-1
DOI :
10.1109/SBMOMO.2001.1008777