• DocumentCode
    1709625
  • Title

    A hemispheric coverage spherical reflector scanning antenna system

  • Author

    Monk, A.D. ; Cardiasmenos, A.G.

  • Author_Institution
    L-3 Commun., ESSCO, Concord, MA, USA
  • Volume
    2
  • fYear
    2001
  • Firstpage
    762
  • Abstract
    The spherical reflector has long been acknowledged for its potential to provide beam scanning from a fixed primary reflecting surface, with no gain loss or pattern distortion over the scan range. This property allows the cost of a scanning antenna system to be reduced, relative to a conventional reflector antenna system, by eliminating the need to move the primary reflector with the appropriate precision, and the need to maintain the primary surface accuracy at all elevation angles. There are applications, such as user terminals for LEO/MEO satellite systems, which require angular coverage over almost the entire upper hemisphere, and which additionally require the ability to use two independent beams. A new spherical reflector antenna design (spherical constellation antenna system, SCAS) has been developed to address these and similar requirements. This system provides 3 independent beams from 3 separate but colocated spherical reflectors, with the beam scanning effected by movement of the 3 feed systems. Various aspects of SCAS are protected under US and international patents.
  • Keywords
    antenna radiation patterns; directive antennas; microwave antennas; multibeam antennas; reflector antenna feeds; satellite communication; scanning antennas; beam scanning antenna; fixed primary reflecting surface; hemispheric coverage; independent beams; spherical constellation antenna system; spherical reflector antenna; user satellite terminals; Apertures; Costs; Feeds; Low earth orbit satellites; Milling machines; Performance gain; Performance loss; Phase distortion; Powders; Reflector antennas;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2001. IEEE
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-7803-7070-8
  • Type

    conf

  • DOI
    10.1109/APS.2001.959835
  • Filename
    959835