DocumentCode :
1710189
Title :
Testability considerations in high-performance avionics processors
Author :
Loo, Thomas
Author_Institution :
Teledyne Syst. Co., Northridge, CA, USA
fYear :
1992
Firstpage :
553
Lastpage :
557
Abstract :
Teledyne Systems has actively pursued the development and introduction of a consistent multilevel digital avionic system hardware design for test (DFT) methodology. This methodology is an evolution of standard logic functions, design rules, techniques, and electronic computer aided design (ECAD) tools, which have been successfully employed on two generations of advanced digital avionic computer systems to address testability at three organizational levels: component, module, and online built-in-self-test (BIST). The benefits are reduced manpower requirements, shorter and more predictable development cycles for larger design, higher levels of quality assurance, and improved maintainability of fielded products
Keywords :
aircraft instrumentation; application specific integrated circuits; built-in self test; computerised instrumentation; design for testability; electronic equipment testing; fault location; integrated circuit testing; logic testing; microprocessor chips; BIST; component testing; design for test; digital avionic computer systems; electronic computer aided design; high-performance avionics processors; maintainability; module testing; multilevel digital avionic system; online built-in-self-test; quality assurance; testability; Aerospace electronics; Built-in self-test; Design for testability; Electronic design automation and methodology; Electronic equipment testing; Hardware; Logic functions; Logic testing; Standards organizations; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital Avionics Systems Conference, 1992. Proceedings., IEEE/AIAA 11th
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-0820-4
Type :
conf
DOI :
10.1109/DASC.1992.282102
Filename :
282102
Link To Document :
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