• DocumentCode
    171032
  • Title

    Immunity to electrical fast transient pulses of computer systems

  • Author

    Ursachi, Corneliu ; Helerea, Elena

  • Author_Institution
    Electr. Eng. & Comput. Sci. Fac., Transilvania Univ. of Brasov, Brasov, Romania
  • fYear
    2014
  • fDate
    23-25 Oct. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The electromagnetic disturbances as low energy electrical fast transients pulse trains generated by switching phenomena in low and medium voltage networks, or by atmospheric discharges on power distribution lines are a presence and an ongoing challenge for electrical and electronic equipment. SR EN 61000-4-4: 2009 standard “Electrical fast transients/burst immunity test” regulates the level of the test pulses. But for particular equipment, the general frame defined by the standard is too large. This paper, after highlighting the characteristics of electromagnetic disturbances that occur when connecting and disconnecting the computing equipment, identifies the appropriate level at which it is necessary to start the test procedure, in order to step toward refining the standard procedure for immunity testing to electrical fast transients, resulting in increased efficiency, measured in decreasing test time and in test cost reduction, effective in increasing the portfolio of clients through competitive prices in the market.
  • Keywords
    cost reduction; discharges (electric); immunity testing; power aware computing; power distribution faults; power distribution lines; power distribution reliability; power markets; switching transients; SR EN 61000-4-4-2009 standard; atmospheric discharges; computer systems; electrical burst immunity test; electrical equipment; electrical fast transient pulse immunity; electromagnetic disturbances; electronic equipment; low-energy electrical fast transient pulse train generation; low-voltage network; medium-voltage network; power distribution lines; switching phenomena; test cost reduction; test pulse level regulation; test time reduction; Immunity testing; Power supplies; Standards; Switches; Switching circuits; Transient analysis; computer systems; electric fast transient pulses; immunity; test level;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied and Theoretical Electricity (ICATE), 2014 International Conference on
  • Conference_Location
    Craiova
  • Type

    conf

  • DOI
    10.1109/ICATE.2014.6972658
  • Filename
    6972658