Title :
Irradiation effects on silica glass by ion microbeam for fabrication of optical elements
Author :
Murai, Masato ; Fukagawa, Kazunari ; Nishikawa, Hiroyuki ; Nakamura, Tomoharu ; Ohki, Yoshimichi ; Oikawa, Masakazu ; Sato, Takahiro ; Arakawa, Kazuki
Author_Institution :
Dept. of Electr. Eng., Shibaura Inst. of Technol., Tokyo, Japan
Abstract :
Irradiation of ion microbeam can induce a local refractive index change in silica glass. We have evaluated the changes in electronic structures of microbeam-irradiated silica glass by means of micro-photoluminescence and phase microscope measurements. Attention should be paid to the energy deposition processes by both electronic and nuclear stopping powers to control the depth distribution of refractive index changes. Also, a chemical effect induced by ion species such as protons at the projected range was also discussed.
Keywords :
band structure; glass; ion beam effects; optical elements; optical microscopy; photoluminescence; refractive index; SiO2; chemical effect; electronic stopping power; electronic structure; energy deposition process; ion microbeam; ion species; irradiation effects; local refractive index change; microphotoluminescence; nuclear stopping power; optical element fabrication; phase microscope measurement; protons; silica glass; Electron microscopy; Glass; Nuclear electronics; Optical device fabrication; Optical refraction; Optical variables control; Particle beam optics; Phase measurement; Refractive index; Silicon compounds;
Conference_Titel :
Electrical Insulating Materials, 2005. (ISEIM 2005). Proceedings of 2005 International Symposium on
Conference_Location :
Kitakyushu
Print_ISBN :
4-88686-063-X
DOI :
10.1109/ISEIM.2005.193377