DocumentCode
1710434
Title
Study on relationship between personality and individual characteristic of EEG for personalized BCI
Author
Ito, Shin-ichi ; Mitsukura, Yasue ; Sato, Katsuya ; Fujisawa, Shoichiro ; Fukumi, Minoru
Author_Institution
Univ. of Tokushima, Tokushima, Japan
fYear
2010
Firstpage
106
Lastpage
111
Abstract
It is an important issue that the relationship between personality and individual characteristic of an electroencephalogram (EEG) for using a personalized brain computer interface on daily basis. In this paper, we introduce a method for discussing the relationship between personality based on egogram scores and the results of the EEG pattern detection. The egogram based on psychological testing is used for analyzing human personality. The frequencies of the EEG analyzed are the components that contain significant and immaterial information and have different importance. We express the different importance through the weight value on frequencies using real-coded genetic algorithm. Then, the EEG patterns, which are determined based on the evaluation of the impression on the music, are classified/detected using the knearest neighbor method. Finally, we discuss the relationship between human personality and the individual characteristic in the EEG analysis. An interesting tendency was that the false-detection ratio of the EEG pattern, meaning the response on negative stimuli, did not become low when the score and level on ego states of Adult was extreme.
Keywords
behavioural sciences; brain-computer interfaces; electroencephalography; genetic algorithms; medical signal detection; medical signal processing; pattern classification; EEG pattern detection; brain computer interface; egogram score; electroencephalogram; genetic algorithm; human personality; k nearest neighbor method; musical impression; personalized BCI; Biological cells; Electrodes; Electroencephalography; Feature extraction; Humans; Pattern matching; Psychology;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Technologies in Electrical and Electronics Engineering (SIBIRCON), 2010 IEEE Region 8 International Conference on
Conference_Location
Listvyanka
Print_ISBN
978-1-4244-7625-1
Type
conf
DOI
10.1109/SIBIRCON.2010.5555320
Filename
5555320
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