DocumentCode :
171131
Title :
Low-phase error and high isolation CMOS active balun
Author :
Sen Wang ; Chih-Hsuan Lee
Author_Institution :
Dept. of Electron. Eng., Nat. Taipei Univ. of Technol., Taipei, Taiwan
fYear :
2014
fDate :
1-6 June 2014
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, a C-band active balun is demonstrated in a standard 0.18-μm CMOS process. Based on the proposed phase-correction technique (PCT) and the bridged-T network (BTN), the balun features low-phase error and high isolation, respectively. The PCT is based on a three balun topology, and the BTN is formed by the output matching networks and an isolation resistor. The balun consumes 1.8 mW from 1.2V-supply voltage, and features a peak gain of 4.6 dB at 4.6 GHz. The measured isolation is better than 18 dB, and the phase error is less than 1.6° from 4.6 GHz to 5.7 GHz.
Keywords :
CMOS integrated circuits; baluns; C-band active balun; CMOS active balun; bridged-T network; frequency 4.6 GHz to 5.7 GHz; gain 4.6 dB; isolation resistor; output matching networks; phase-correction technique; power 1.8 mW; size 0.18 mum; voltage 1.2 V; CMOS integrated circuits; Impedance matching; Active balun; gain error; phase correction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium (IMS), 2014 IEEE MTT-S International
Conference_Location :
Tampa, FL
Type :
conf
DOI :
10.1109/MWSYM.2014.6848362
Filename :
6848362
Link To Document :
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