Title :
Spread spectrum clock generator with delay cell array to reduce the EMI from a high-speed digital system
Author :
Kim, Jonghoon ; Kam, Dong Gun ; Kim, Joungho
Author_Institution :
Memory Div., Samsung Electron., Kyeonggi-Do, South Korea
Abstract :
In high-speed digital systems, most of the EMI from the system is caused by high-speed digital clock drivers and synchronized circuits. In order to reduce the EMI from the system clocks, spread spectrum clock (SSC) techniques that modulate the system clock frequency have been proposed. A conventional spread spectrum clock generator with a phase locked loop (SSCG-PLL) has been implemented by controlling period jitter. However, the conventional SSCG-PLL becomes more difficult to implement at higher clock frequencies, in the GHz range, because of the random period jitter of the PLL. Furthermore, the attenuation of EMI is decreased due to the random period jitter of the PLL. To overcome these problems associated with the random period jitter, we propose a spread spectrum clock generator with a delay cell array (SSCG-DCA), which controls the position of clock transitions. Measurement and simulation have demonstrated that the proposed SSCG-DCA is easier to implement and attenuating the EMI is more effective compared with the conventional SSCG-PLL. The proposed SSCG-DCA was implemented on a chip using a 0.35 μm CMOS process and a 9 dB attenuation of the EMI was achieved at 390 MHz.
Keywords :
driver circuits; electromagnetic interference; jitter; phase locked loops; pulse generators; 0.35 micron; 390 MHz; 9 dB; EMI attenuation; delay cell array; digital clock drivers; high-speed digital system; phase locked loop; random period jitter; spread spectrum clock generator; synchronized circuits; system clock frequency; Attenuation; Clocks; Delay; Digital systems; Driver circuits; Electromagnetic interference; Frequency; Jitter; Phase locked loops; Spread spectrum communication;
Conference_Titel :
Electromagnetic Compatibility, 2004. EMC 2004. 2004 InternationalSymposium on
Print_ISBN :
0-7803-8443-1
DOI :
10.1109/ISEMC.2004.1349928