• DocumentCode
    1711508
  • Title

    Mass spectrometric investigations of a plasma jet chemical vapor deposition reactor

  • Author

    Kull, A.E. ; Cappelli, Mark A.

  • Author_Institution
    Div. of Thermosci., Stanford Univ., CA, USA
  • fYear
    1999
  • Firstpage
    194
  • Abstract
    Summary form only given. High density plasma-enhanced chemical vapor deposition is a technology of growing importance in the deposition of materials for the semiconductor and optoelectronics industries. Direct current (DC) plasma jets (also known as arcjets) are a particular form of high density plasma source that produce a high velocity (5-10 km/sec) plasma stream (20-30% dissociation fraction, n/sub e//spl sim/10/sup 13/ cm/sup -3/). The plasma jet provides large convective fluxes of chemically reactive radical species, in super-equilibrium concentrations, that are stagnated on a substrate on which film growth occurs. High quality films of materials such as diamond, cubic boron nitride, aluminum nitride, and gallium nitride have been grown by this method at growth rates that are high compared with other deposition methods.
  • Keywords
    mass spectra; plasma CVD; plasma devices; plasma diagnostics; plasma jets; AlN; AlN film; BN; C; DC plasma jets; GaN; GaN film; arcjets; chemically reactive radical species; convective fluxes; cubic BN film; diamond film; dissociation fraction; film growth; growth rates; high density plasma source; high density plasma-enhanced chemical vapor deposition; high quality films; mass spectrometric investigations; optoelectronics industries; plasma jet chemical vapor deposition reactor; plasma stream; semiconductor industries; stagnation; substrate; super-equilibrium concentrations; Chemical industry; Chemical technology; Chemical vapor deposition; Mass spectroscopy; Plasma applications; Plasma chemistry; Plasma density; Plasma materials processing; Plasma sources; Semiconductor materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1999. ICOPS '99. IEEE Conference Record - Abstracts. 1999 IEEE International Conference on
  • Conference_Location
    Monterey, CA, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-5224-6
  • Type

    conf

  • DOI
    10.1109/PLASMA.1999.829476
  • Filename
    829476