Title :
20-MHz bandwidth continuous-time delta-sigma modulator for EPWM transmitter
Author :
Cho, Young-Kyun ; Lee, Sung Jun ; Jang, Seung Hyun ; Park, Bong Hyuk ; Jung, Jae Ho ; Lee, Kwang Chun
Author_Institution :
Adv. Mobile Commun. Res. Dept., Electron. & Telecommun. Res. Inst. (ETRI), Daejeon, South Korea
Abstract :
A 1.5-bit 20-MHz bandwidth continuous-time delta-sigma modulator (CT-DSM), which is suitable for envelope pulse-width modulation (EPWM) transmitters, is presented. To compensate the process-voltage-temperature variation, a resistor calibration method is proposed. The proposed calibration scheme improves a signal-to-quantization-noise-ratio (SQNR) by 18%. The switched capacitor digital-to-analog converter (DAC) and tri-level output DAC are adopted to improve non-ideal effects and implement multi-level encoding, respectively. Over 44 dB SQNR has been achieved for all corner simulation condition with an oversampling ratio of 13.056 and 20-MHz of bandwidth. The power consumption of the modulator is 11.6 mW from the 1.08 V supply. 1.74% of error vector magnitude can be obtained for a 20 MHz LTE signal with a 9.7 dB peak-to-average power ratio.
Keywords :
Long Term Evolution; delta-sigma modulation; digital-analogue conversion; encoding; modulators; radio transmitters; EPWM transmitter; LTE signal; SQNR; bandwidth 13.056 MHz; bandwidth 20 MHz; bandwidth continuous-time delta-sigma modulator; envelope pulse-width modulation transmitters; error vector magnitude; multilevel encoding; oversampling ratio; peak-to-average power ratio; power 11.6 mW; power consumption; process-voltage-temperature variation; signal-to-quantization-noise-ratio; switched capacitor digital-to-analog converter; tri-level output DAC; voltage 1.08 V; Calibration; Capacitors; Encoding; Modulation; Noise; Resistors; Transmitters; Continuous-time delta-sigma modulator (CT-DSM); DAC; PVT variation; pulse width modulation; transmitter;
Conference_Titel :
Wireless Communication Systems (ISWCS), 2012 International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4673-0761-1
Electronic_ISBN :
2154-0217
DOI :
10.1109/ISWCS.2012.6328495