DocumentCode :
1712006
Title :
Closed-loop direct parametric identification of magnetohydrodynamic normal modes spectra in EXTRAP-T2R reversed-field pinch
Author :
Olofsson, Erik ; Brunsell, Per ; Drake, James
Author_Institution :
KTH/EES Fusion Plasma Phys. (Assoc. EURATOM-VR), Stockholm, Sweden
fYear :
2009
Firstpage :
1449
Lastpage :
1454
Abstract :
The reversed-field pinch (RFP) EXTRAP-T2R (T2R) is a plasma physics experiment with particular relevance for magnetic confinement fusion (MCF) research. T2R is very well equipped for investigations of magnetohydrodynamic (MHD) instabilities known as resistive-wall modes (RWMs), growing on a time-scale set by a surrounding non-perfectly conducting shell. The RWM instability is also subject of intense research in tokamak experiments (another MCF configuration). Recently, multiple RWMs have been stabilized in T2R using arrays of active (current-carrying) and sensor (voltage-measuring) coils equidistributed on the shell. In this paper, the MHD normal modes dynamics is probed in the required feedback operation by simultaneously, and pseudo-randomly, exciting the spectrum in the spatial sense. Spectra are then extracted by prediction-error minimization based on an observer that tracks dynamically aliased modes and the results thus obtained are related, and compared, to established linear MHD stability theory. This pioneer study at T2R is, arguably, appealling both to plasma physicists and automatic control staff.
Keywords :
Tokamak devices; closed loop systems; plasma instability; plasma magnetohydrodynamics; plasma probes; reversed field pinch; EXTRAP-T2R reversed-field pinch; RWM instability; closed-loop direct parametric identification; current-carrying coils; dynamically aliased modes; magnetic confinement fusion; magnetohydrodynamic normal modes spectra; prediction-error minimization; resistive-wall modes; shell; tokamak; voltage-measuring coils; Coils; Feedback; Magnetic confinement; Magnetohydrodynamics; Physics; Plasma confinement; Sensor arrays; Stability; Tokamaks; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control Applications, (CCA) & Intelligent Control, (ISIC), 2009 IEEE
Conference_Location :
St. Petersburg
Print_ISBN :
978-1-4244-4601-8
Electronic_ISBN :
978-1-4244-4602-5
Type :
conf
DOI :
10.1109/CCA.2009.5281183
Filename :
5281183
Link To Document :
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