Reducing RF parameter tests for test cost reduction: device model, hypothesis testing and experiment verification

Author

Awad, Maricttc ; Li, Jing

Author_Institution

IBM Microelectronics

fYear

2003

Firstpage

265

Lastpage

268

Keywords

Circuit testing; Costs; Hardware; Linear regression; Logistics; Low-noise amplifiers; Microelectronics; Noise figure; RF signals; Radio frequency;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Components and Technology Conference, 2003. Proceedings. 53rd

ISSN

0569-5503

Print_ISBN

0-7803-7791-5

Type

DOI

10.1109/ECTC.2003.1216287

Filename

1216287

Link To Document