• DocumentCode
    1712330
  • Title

    A low power fault-tolerance architecture for the kernel density estimation based image segmentation algorithm

  • Author

    Li, Peng ; Lilja, David J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Minnesota, Minneapolis, MN, USA
  • fYear
    2011
  • Firstpage
    161
  • Lastpage
    168
  • Abstract
    The kernel density estimation (KDE)-based image segmentation algorithm has excellent segmentation performance. However, this algorithm is computational intensive. In addition, although this algorithm can tolerant noise in the input images, such as the noise due to snow, rain, or camera shaking, it is sensitive to the noise from the internal computing circuits, such as the noise due to soft errors or PVT (process, voltage, and temperature) variation. Tolerating this kind of noise becomes more and more important as device scaling continues to nanoscale dimensions. Stochastic computing, which uses streams of random bits (stochastic bits streams) to perform computation with conventional digital logic gates, can guarantee reliable computation using unreliable devices. In this paper, we present a stochastic computing implementation of the KDE-based image segmentation algorithm. Our experimental results show that, under the same time constraint, the stochastic implementation is much more tolerant of faults and consumes less hardware and power compared to a conventional (nonstochastic) implementation. Furthermore, compared to a Triple Modular Redundancy (TMR) fault tolerance technique, the stochastic architecture tolerates substantially more soft errors with lower power consumption.
  • Keywords
    estimation theory; fault tolerant computing; image segmentation; low-power electronics; KDE; device scaling; kernel density estimation based image segmentation algorithm; low power fault-tolerance architecture; stochastic computing; triple modular redundancy fault tolerance technique; Encoding; Equations; Fault tolerance; Fault tolerant systems; Image segmentation; Kernel; Noise; Computer reliability; fault tolerance; image segmentation; logic design; low-energy; low-power; stochastic computing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Application-Specific Systems, Architectures and Processors (ASAP), 2011 IEEE International Conference on
  • Conference_Location
    Santa Monica, CA
  • ISSN
    2160-0511
  • Print_ISBN
    978-1-4577-1291-3
  • Electronic_ISBN
    2160-0511
  • Type

    conf

  • DOI
    10.1109/ASAP.2011.6043264
  • Filename
    6043264