Title :
Single compound complementary split-ring resonator for simultaneously measuring permittivity and thickness
Author :
Chieh-Sen Lee ; Chin-Lung Yang
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
This paper presents a single compound complementary split-ring (SC-CSRR) to induce dual resonance frequencies for simultaneously measuring the permittivity and thickness of a material. The dual resonance frequencies, fL and fH, are generated using two distinct resonator current lengths in a single CSRR. By using the proposed methods, the ratio of dual resonance frequency relationship can be used to determine the thickness of the material under test (MUT); the permittivity is linearly related to the resonance frequency. A simple and low-cost SC-CSRR measurement method for assessing the permittivity of materials in a compact area was numerically analyzed and experimentally verified. Testing yielded average measurement errors of 6.26% and 4.63% for the thickness and permittivity, respectively.
Keywords :
dielectric materials; materials testing; measurement errors; microwave detectors; microwave resonators; numerical analysis; permittivity measurement; thickness measurement; MUT; SC-CSRR measurement method; dual resonance frequency generation; material under test; measurement errors; numerical analysis; permittivity measurement; single compound complementary split ring resonator; thickness measurement; Computer aided software engineering; Indexes; Permittivity; Resonant frequency; Thickness measurement; Complementary split-ring resonators (CSRR); noninvasive; permittivity measurement; thickness measurement;
Conference_Titel :
Microwave Symposium (IMS), 2014 IEEE MTT-S International
Conference_Location :
Tampa, FL
DOI :
10.1109/MWSYM.2014.6848413