Title :
Effects of open stubs associated with plated through-hole vias in backpanel designs
Author :
Deng, Shaowei ; Mao, Jingkun ; Hubing, Todd H. ; Drewniak, James L. ; Fan, Jun ; Knighten, James L. ; Smith, Norman W. ; Alexander, Ray
Author_Institution :
Electr. & Comput. Eng. Dept., Missouri Univ., Rolla, MO, USA
Abstract :
Plated through-hole (PTH) vias are commonly used in printed circuit boards. They usually leave open stubs if the signal(s) does not transition the entire depth of the board. These open stubs can have a negative impact on signal transmission. This summary reports the investigation of the impact of the open via stubs in a typical backpanel design.
Keywords :
equivalent circuits; finite element analysis; printed circuit design; transmission line theory; FEM; backpanel designs; differential transmission line; equivalent circuit; eye diagram; open stubs; plated through-hole vias; printed circuit boards; signal transmission; Capacitance; Design engineering; Dielectric substrates; Distributed parameter circuits; Equivalent circuits; Geometry; Manufacturing; Pins; Printed circuits; Transmission lines;
Conference_Titel :
Electromagnetic Compatibility, 2004. EMC 2004. 2004 InternationalSymposium on
Print_ISBN :
0-7803-8443-1
DOI :
10.1109/ISEMC.2004.1349966
