DocumentCode
1712499
Title
Optical monitoring of contamination on high-voltage device
Author
Sun, Yan ; Zhao, Wen-Bin ; Zhang, Guan-Jun
Author_Institution
Sch. of Electr. Eng., Xi´´an Jiaotong Univ., China
Volume
2
fYear
2005
Firstpage
443
Abstract
A novel optical sensor for contamination monitoring is proposed. Based on the detection of the light intensity changes due to the contamination in light path, its severe status can be measured. The measurement principle is theoretically described. A principle prototype is set up, and the related experimental results indicate the feasibility of the method.
Keywords
insulator contamination; insulator testing; optical sensors; power cable insulation; power cable testing; substation insulation; high-voltage device; insulator contamination; light intensity change detection; light path contamination monitoring; optical sensor; power lines; substation; Glass; Insulation; Monitoring; Optical devices; Optical films; Optical scattering; Optical sensors; Pollution measurement; Surface contamination; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulating Materials, 2005. (ISEIM 2005). Proceedings of 2005 International Symposium on
Print_ISBN
4-88686-063-X
Type
conf
DOI
10.1109/ISEIM.2005.193584
Filename
1496184
Link To Document