Title :
Optical monitoring of contamination on high-voltage device
Author :
Sun, Yan ; Zhao, Wen-Bin ; Zhang, Guan-Jun
Author_Institution :
Sch. of Electr. Eng., Xi´´an Jiaotong Univ., China
Abstract :
A novel optical sensor for contamination monitoring is proposed. Based on the detection of the light intensity changes due to the contamination in light path, its severe status can be measured. The measurement principle is theoretically described. A principle prototype is set up, and the related experimental results indicate the feasibility of the method.
Keywords :
insulator contamination; insulator testing; optical sensors; power cable insulation; power cable testing; substation insulation; high-voltage device; insulator contamination; light intensity change detection; light path contamination monitoring; optical sensor; power lines; substation; Glass; Insulation; Monitoring; Optical devices; Optical films; Optical scattering; Optical sensors; Pollution measurement; Surface contamination; Testing;
Conference_Titel :
Electrical Insulating Materials, 2005. (ISEIM 2005). Proceedings of 2005 International Symposium on
Print_ISBN :
4-88686-063-X
DOI :
10.1109/ISEIM.2005.193584
