Title :
Thermal modeling and measurement of AlGaN/GaN FETs built on sapphire and SiC substrates
Author :
Park, Jeong ; Kakovitch, Dimitri ; Shin, Moo Whan ; Lee, Chin C.
Author_Institution :
University of Califomia
Keywords :
Aluminum gallium nitride; Electrical resistance measurement; FETs; Gallium nitride; HEMTs; MODFETs; Silicon carbide; Substrates; Temperature measurement; Thermal conductivity;
Conference_Titel :
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
Print_ISBN :
0-7803-7791-5
DOI :
10.1109/ECTC.2003.1216314
