Title :
A 0.5 V/100 MHz over-VCC grounded data storage (OVGS) SRAM cell architecture with boosted bit-line and offset source over-driving schemes
Author :
Yamauchi, Hiroyuki ; Iwata, Toru ; Akamatsu, Hironori ; Matsuzawa, Akira
Author_Institution :
Semicond. Res. Center, Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
Abstract :
This paper proposes a 0.5 V/100 MHz/sub-5 mW-operated 1-Mbit SRAM cell architecture which uses an over-VCC grounded data storage (OVGS) scheme. The key target of OVGS is to minimize the charge amount supplied from the embedded charge pump circuits, which are required to boost the effective gate to source voltage (V0=V GS-VT) up to 0.8 V necessary to achieve 100 MHz-operation even at 0.5 V single power-supply. Thus, the key low-power strategy of OVGS is “putting the right (higher efficiency) boosted power-supply from the charge pump circuit into the right position in the SRAM cell”. This paper focuses on why OVGS can realize a greater saving of the charge amount supplied from the boosted power-line and can reduce the power dissipation to ⩽1/30.4 and ⩽1/3.9 compared to the previously reported negative source drive (NSD) scheme (Mizuno et al., 1995) and negative word-line drive (NWD) scheme (Itoh et al., 1996), respectively, while achieving a 0.5 V/100 MHz-operation
Keywords :
CMOS memory circuits; SRAM chips; circuit optimisation; memory architecture; 0.5 V; 1 Mbit; 100 MHz; 5 mW; CMOS SRAM; SRAM cell architecture; boosted bit-line scheme; charge amount minimization; embedded charge pump circuits; gate to source voltage; low-power strategy; offset source over-driving scheme; over-VCC grounded data storage; power dissipation; Capacitance; Circuits; Degradation; Drives; Fault location; Power dissipation; Random access memory; Subthreshold current; Threshold voltage;
Conference_Titel :
Low Power Electronics and Design, 1996., International Symposium on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-3571-6
DOI :
10.1109/LPE.1996.542729