DocumentCode :
1712870
Title :
Investigation Of The Relationship Of Sar Hh And Vv Backscatter To Surface Roughness And Dielectric Constant
Author :
Wall, S.D. ; Van Zyl, J.A.
Author_Institution :
Jet Propulsion Laboratory California Institute of Technology Pasadena CA 91109 USA
Volume :
1
fYear :
1989
Firstpage :
22
Lastpage :
23
Keywords :
Airborne radar; Backscatter; Dielectric constant; Laboratories; Predictive models; Propulsion; Radar polarimetry; Rough surfaces; Surface roughness; Synthetic aperture radar;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 1989. IGARSS'89. 12th Canadian Symposium on Remote Sensing., 1989 International
Type :
conf
DOI :
10.1109/IGARSS.1989.567139
Filename :
567139
Link To Document :
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