Title :
Near-field techniques for detecting EMI sources
Author :
Baudry, David ; Bicrel, F. ; Bouchelouk, L. ; Louis, A. ; Mazari, B. ; Eudeline, P.
Author_Institution :
IRSEEM, Mont-Saint-Aignan, France
Abstract :
A completely automatic near-field mapping system has been developed within IRSEEM (French research institute for electronic embedded systems) in order to determine the electric field radiated by electronic systems. This test bench uses a 3D probe positioning system to make accurate measurements. The paper presents a validation of the test bench on a microstrip line and experimental results realized on a diode limiter function.
Keywords :
electric field measurement; electric noise measurement; electromagnetic interference; electronic equipment testing; test facilities; 3D probe positioning system; EMI source detection; diode limiter function; electric field radiation; electronic systems; microstrip line; near-field mapping system; test bench; Circuit testing; Electric variables measurement; Electromagnetic interference; Electromagnetic measurements; Laser modes; Microstrip; Probes; Robot kinematics; Robot vision systems; System testing;
Conference_Titel :
Electromagnetic Compatibility, 2004. EMC 2004. 2004 InternationalSymposium on
Print_ISBN :
0-7803-8443-1
DOI :
10.1109/ISEMC.2004.1349987
