• DocumentCode
    1712999
  • Title

    A 1GS/s low-power low-kickback noise comparator in CMOS process

  • Author

    Baradaranrezaeii, Ali ; Abdollahi, Roozbeh ; Hadidi, Khayrollah ; Khoei, Abdollah

  • Author_Institution
    Microelectron. Res. Lab., Urmia Univ., Urmia, Azerbaijan
  • fYear
    2011
  • Firstpage
    106
  • Lastpage
    109
  • Abstract
    A high speed comparator based on a high DC-gain folded-cascode amplifier is presented. Four switches rearrange the structure to speed up the comparison process and prevent kickback noise with a simple set of controlling signals. The circuit is a rail-to-rail folded-cascode amplifier during reset/evaluation period which transforms into two back-to-back inverters during the latch period to speed up the settling. The reset and the evaluation sequences are merged due to the special structure presented. This means that higher speed is achieved while reset time can be increased to erase the previous data completely. The comparator has been simulated in different conditions such as: temperature fluctuation, variations in process corners, power supply noise of 250mVp-p, clock skew of 80ps and applying the input signal in the most critical case. Results confirm that 1GS/s with 6-bit resolution is achieved for 1.6Vp-p and 10mV offset voltage while the power consumption is about 1mW. The most of the power supply noise is rejected while kickback noise and clock feed-through is reduced as well. Using the minimum size devices leads to a compact layout and die size of about 250(μm)2.
  • Keywords
    CMOS digital integrated circuits; amplifiers; analogue-digital conversion; comparators (circuits); integrated circuit noise; invertors; low-power electronics; CMOS process; back-to-back inverters; clock feed-through; clock skew; die size; latch period; low-power low-kickback noise comparator; power supply noise; rail-to-rail folded-cascode amplifier; reset-evaluation period; voltage 10 mV; word length 6 bit; Clocks; Inverters; Latches; Noise; Power supplies; Simulation; Threshold voltage; CMOS Comparator; Clock Feed-Through; Flash ADCs; High Speed ADCs; Kickback Noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuit Theory and Design (ECCTD), 2011 20th European Conference on
  • Conference_Location
    Linkoping
  • Print_ISBN
    978-1-4577-0617-2
  • Electronic_ISBN
    978-1-4577-0616-5
  • Type

    conf

  • DOI
    10.1109/ECCTD.2011.6043288
  • Filename
    6043288