Title :
Research on the Emission Uniformity of Explosive Emission Cathodes in Foilless Diodes
Author :
Jun Sun ; Ping Wu ; Shaofei Huo ; Weibing Tan ; Hao Shao ; Changhua Chen ; Guozhi Liu
Author_Institution :
Northwest Inst. of Nucl. Technol., Xi´an, China
Abstract :
Some factors that influence the emission uniformity of explosive emission cathodes (EECs) in foilless diodes such as the guiding magnetic field strength and the rise rate of electric field have been researched in former literatures. This paper is concentrated on another factor that has been overlooked previously, i.e., the defects with dimensions of tens of micrometers on cathode surfaces, especially at blade edges. It is shown that these defects will significantly worsen the emission uniformity of EECs by introducing extraordinarily large microscopic field enhancement factors, and thus they should be eliminated. The micrometer-scale irregularities, however, should be maintained to provide effective emission micropoints. Meanwhile, the outer edge of an annular cathode blade should be rounded off to improve the emission uniformity. After being disposed like this, the emission uniformity of annular graphite cathodes in a foilless diode is obviously improved, which leads to an increase of energy efficiency by more than 20% by broadening the microwave pulse duration under a power level of 2.8 GW for an X-band relativistic backward wave oscillator.
Keywords :
cathodes; electron field emission; microwave diodes; EECs; X-band relativistic backward wave oscillator; annular cathode blade; annular graphite cathodes; blade edges; cathode surfaces; electric field; emission micropoints; emission uniformity; explosive emission cathodes; foilless diodes; guiding magnetic field strength; micrometer-scale irregularities; microscopic field enhancement factors; microwave pulse duration; power 2.8 GW; Blades; Cathodes; Explosives; Microwave theory and techniques; Plasmas; Surface morphology; Surface treatment; Cathode morphology; emission uniformity; explosive emission cathodes (EECs); foilless diodes; high-power microwave (HPM);
Journal_Title :
Plasma Science, IEEE Transactions on
DOI :
10.1109/TPS.2014.2338301