Title :
Microstrip discontinuity modeling for high-speed interconnects
Author :
Roy, L. ; Labonté, S. ; Li, M.
Author_Institution :
Dept. of Electr. Eng., Ottawa Univ., Ont., Canada
Abstract :
The development of lumped-element models for arbitrary microstripline discontinuities is described. An EM-based methodology is employed, consisting of initial characterization of the discontinuities using exact EM field solvers, and subsequent fitting of the results to simple equivalent circuits. The applicability of the method is illustrated by considering a microstrip slit example
Keywords :
equivalent circuits; integrated circuit interconnections; lumped parameter networks; microstrip discontinuities; waveguide theory; EM-based methodology; characterization; equivalent circuits; high-speed interconnects; lumped-element models; microstrip discontinuity modeling; microstrip slit example; microstripline discontinuities; Capacitors; Circuit optimization; Circuit simulation; Computational modeling; Design automation; Electromagnetic waveguides; Equivalent circuits; Integrated circuit interconnections; Microstrip; Scattering parameters;
Conference_Titel :
Electrical and Computer Engineering, 1995. Canadian Conference on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-2766-7
DOI :
10.1109/CCECE.1995.528153
