DocumentCode :
1713517
Title :
A novel electrically conductive wafer through hole filled vias interconnect for 3D MEMS packaging
Author :
Premachandran, C.S. ; Nagarajan, Ranganathan ; Yu, Chen ; Xiolin, Zang ; Choong, Chong Ser
Author_Institution :
histitute of Microclectronics
fYear :
2003
Firstpage :
627
Lastpage :
630
Keywords :
Conducting materials; Copper; Etching; Filling; Integrated circuit interconnections; Microelectromechanical devices; Micromechanical devices; Plastic packaging; Silicon; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
ISSN :
0569-5503
Print_ISBN :
0-7803-7791-5
Type :
conf
DOI :
10.1109/ECTC.2003.1216346
Filename :
1216346
Link To Document :
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