DocumentCode
1713517
Title
A novel electrically conductive wafer through hole filled vias interconnect for 3D MEMS packaging
Author
Premachandran, C.S. ; Nagarajan, Ranganathan ; Yu, Chen ; Xiolin, Zang ; Choong, Chong Ser
Author_Institution
histitute of Microclectronics
fYear
2003
Firstpage
627
Lastpage
630
Keywords
Conducting materials; Copper; Etching; Filling; Integrated circuit interconnections; Microelectromechanical devices; Micromechanical devices; Plastic packaging; Silicon; Wafer scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
ISSN
0569-5503
Print_ISBN
0-7803-7791-5
Type
conf
DOI
10.1109/ECTC.2003.1216346
Filename
1216346
Link To Document